Transmission Electron Microscopy (TEM) is a high-resolution imaging method for studying the internal structure of materials at an atomic scale, where an electron beam passes through a thin sample, and the transmitted electrons create detailed images. Energy Dispersive X-Ray Spectroscopy (EDS) is used to detect the elemental composition of materials by capturing X-rays emitted during interactions with an electron beam. These techniques are widely used in materials science, nanotechnology, and biological research to examine crystal structures, defects, and the detailed morphology of various materials and biological tissues.